Implementation of Enhanced Quick-scan Technique for Time-Resolved XAFS Experiment at PLS

Quick-scan is an important technique for the time-resolved experiments to investigate structural variation in rapid chemical reactions or phase transitions under external perturbations in the material science. Our new quick-scan technique, implemented at BL3C1 of PLS, adopts PCI-bus instead of CAMAC based system which was used in the default quick-scan system. It uses a digital I/O and a counter/timer PCI board, which are connected to DCM encoder and to VFC, respectively. Since the trigger signal is originated for a fixed interval from the counter/timer board operating on 80 MHz internal clock, all channels are synchronized without dead or delay time. When the trigger interval was set as 20 ms for each data point, it took ∼100 seconds for each full scan at 7 keV in the range of -200 ∼ 1000 eV, and the energy step sizes corresponded to ∼0.7 eV. Overall performances of the Quick-XAFS technique will be demonstrated through an in situ electrochemical experiment for the Li-ion battery cathode material