Published October 2007
| Version v1
Journal article
Dielectronic recombination process in laser-produced Xe plasmas
Creators
- 1. School of Sciences, Beijing Univ. of Posts and Telecommunications, Beijing (China)
Description
Dielectronic recombination (DR) coefficients for the ground-state ion of Ni-like Xe have been calculated through Cu-like 3d9 nln'f(n,n'=4,5,6) inner-shell excited configurations using the spin-orbit-split array (SOSA) model. Resonant and nonresonant radiative stabilizing transitions and decays to autoionizing levels followed by radiative cascades are included. Collisional transitions following electron capture are neglected. Nonresonant stabilizing transitions are found to enhance DR rates, and may even dominate the process at low electron temperature. The trend of the DR rate coefficients and the ratio of dielectronic satellite lines intensities with the changes of the electron temperature are discussed. (authors)
Additional details
Publishing Information
- Journal Title
- Journal of Atomic and Molecular Physics
- Journal Volume
- 24
- Journal Issue
- 5
- Journal Page Range
- p. 1115-1117
- ISSN
- 1000-0364
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 39118430
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- AUTOIONIZATION; COPPER; ELECTRON CAPTURE; ELECTRON TEMPERATURE; ELECTRONIC STRUCTURE; ENERGY-LEVEL TRANSITIONS; GROUND STATES; INNER-SHELL EXCITATION; L-S COUPLING; LASER-PRODUCED PLASMA; RADIATIVE DECAY; RECOMBINATION; TEMPERATURE DEPENDENCE; XENON IONS
- Descriptors DEC
- CAPTURE; CHARGED PARTICLES; COUPLING; DECAY; ELEMENTS; ENERGY LEVELS; ENERGY-LEVEL TRANSITIONS; EXCITATION; INTERMEDIATE COUPLING; IONIZATION; IONS; METALS; PARTICLE DECAY; PLASMA; TRANSITION ELEMENTS
Optional Information
- Notes
- 2 figs., 2 tabs.,