Published July 18, 2013
| Version v1
Journal article
Ion beam analysis in cultural heritage studies: Milestones and perspectives
Creators
- 1. Centre for research and restoration of the museums of France, Palais du Louvre Paris (France)
Description
For three decades, ion beam analysis (IBA) in external mode was considered as the best choice for the characterisation of cultural heritage materials, as it combines excellent analytical performance and non-invasive character. However, in recent years, other analytical techniques arose as serious competitors, such as those based on synchrotron radiation (X-ray absorption, fluorescence or diffraction) or those using portable instruments (XRF, micro-Raman). It is shown that nevertheless IBA remains unmatched thanks to two unique features, namely the analysis of light elements and the high-resolution 3D chemical imaging
Additional details
Identifiers
- DOI
- 10.1063/1.4812900;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1530
- Journal Issue
- 1
- Journal Page Range
- p. 11-24
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- International conference on multidisciplinary applications of nuclear physics with ion beams
- Acronym
- ION BEAMS '12
- Dates
- 6-8 Jun 2012
- Place
- Legnaro, Padova (Italy)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44077768
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CULTURAL OBJECTS; IMAGES; ION BEAMS; NONDESTRUCTIVE ANALYSIS; RAMAN SPECTRA; RESOLUTION; SYNCHROTRON RADIATION; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROSCOPY
- Descriptors DEC
- BEAMS; BREMSSTRAHLUNG; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; NONDESTRUCTIVE ANALYSIS; RADIATIONS; SCATTERING; SPECTRA; SPECTROSCOPY; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC