Structure characterization of metamict and glassy lead phosphates
Creators
- 1. Massachusetts Inst. of Tech., Cambridge (United States). Dept. of Materials Science and Engineering
Description
Single crystals of Pb2P2O7 (beam stable under 200 kV TEM electrons to a fluence > 1027 e/m2 and an ionizing dose > 1014Gy) were rendered metamict (amorphized) with ion-implantation 100 kV P+ ions with several fluences. Pb2P2O7 and PbO · P2O5 glasses were also ion implanted at identical fluences. Radial distribution functions of metamict and glassy phosphates are being generated using energy filtered electron diffraction (EFED) data collected on 100 kV field emission STEM (VG HB-5). Ion implanted lead phosphate glasses exhibit a significant difference in their FSDP as compared to the non-irradiated ones. XTEM results also show that ion-beam damage layer was around 200 nm deep. XTEM-HREM structure images of ion-implanted single crystals, along with their optical diffraction analysis will be presented and briefly discussed
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (United States)
- ISBN
- 1-55899-174-3
- Imprint Title
- Beam solid interactions: Fundamentals and applications
- Imprint Pagination
- 932 p.
- Journal Page Range
- p. 559-564.
Conference
- Title
- 16. Materials Research Society (MRS) fall meeting.
- Dates
- 30 Nov - 5 Dec 1992.
- Place
- Boston, MA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 25036152
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CHEMICAL COMPOSITION; EXPERIMENTAL DATA; LEAD PHOSPHATES; PHOSPHORUS IONS; PHYSICAL RADIATION EFFECTS
- Descriptors DEC
- CHARGED PARTICLES; DATA; INFORMATION; IONS; LEAD COMPOUNDS; NUMERICAL DATA; OXYGEN COMPOUNDS; PHOSPHATES; PHOSPHORUS COMPOUNDS; RADIATION EFFECTS
Optional Information
- Secondary number(s)
- CONF-921101--.