Numerical study of low-frequency vibrations in amorphous silicon
Creators
- 1. Naval Research Laboratory, Washington DC 20375-5345 (United States)
- 2. Department of Physics and Astonomy, State University of New York, Stony Brook, New York 11794-3800 (United States)
- 3. Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
Description
Exact numerical vibrational eigenvectors and eigenvalues are studied for atomistic models of amorphous silicon (a-Si) with 216, 1000, and 4096 atoms in the periodic repeat unit. At the lowest frequencies, eigenvalues are sparse and eigenvectors are fairly plane-wave-like. However, some eigenvectors are open-quotes quasilocalizedclose quotes or open-quotes resonant.close quotes They are temporarily trapped in local regions of undercoordination. The present paper finds the following. (1) The open-quotes quasilocalizedclose quotes modes are to a large extent artifacts of the finite size of the model systems. (2) The lower energy modes of realistic models in the harmonic approximation are broadened versions of the corresponding crystalline acoustic vibrations, with fairly well-defined wave vectors Q. The intrinsic broadening due to glassy disorder increases rapidly with Q, until at intermediate frequencies a meaningful Q can no longer be assigned. (3) The intrinsic broadening due to disorder is strong enough to suppress thermal conductivity to the level seen experimentally, with no need for special anharmonic effects or localization, except for the influence of two-level systems on the modes at very low frequencies. (4) There is no inconsistency between the broadened propagating-wave description of low-energy modes and the occurrence of open-quotes excess modesclose quotes in specific heat or in spectra. However, amorphous silicon seems to have very few such excess modes. (5) open-quotes Excess modesclose quotes and the plateau in κ(T) are not closely related, since the former is absent and the latter present in both experiment and in our calculations for a-Si. Our analysis agrees closely with the recent study of amorphous SiO2 by Dell close-quote Anna et al. copyright 1999 The American Physical Society
Additional details
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter
- Journal Volume
- 59
- Journal Issue
- 5
- Journal Page Range
- p. 3551-3559
- ISSN
- 0163-1829
- CODEN
- PRBMDO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30021507
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Descriptors DEI
- AMORPHOUS STATE; EIGENVALUES; EIGENVECTORS; LATTICE VIBRATIONS; NUMERICAL SOLUTION; SILICON; SPECIFIC HEAT; THERMAL CONDUCTIVITY
- Descriptors DEC
- ELEMENTS; PHYSICAL PROPERTIES; SEMIMETALS; THERMODYNAMIC PROPERTIES