Published 1975
| Version v1
Book
Spectrometry with solid-state detectors
Description
Topics covered include: basic characteristics of x-ray and electron spectrometers (materials, detector types, detector structure and mounting, entrance windows, factors affecting energy resolution); x-ray spectrometers (energy calibration, efficiency, peak-to-tail ratio); electron spectrometers (energy calibration, efficiency, peak-to-tail ratio, special arrangements); and a discussion of prospective developments in the technology. 18 figures, 8 tables, 149 references
Additional details
Publishing Information
- Publisher
- Academic Press, Inc.
- Imprint Place
- New York
- Imprint Title
- Atomic inner-shell processes. Vol. II
- Imprint Pagination
- p. 123-167.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 8293884
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ELECTRON SPECTROMETERS; GE SEMICONDUCTOR DETECTORS; KEV RANGE 01-10; KEV RANGE 10-100; REVIEWS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
- Descriptors DEC
- DOCUMENT TYPES; ENERGY RANGE; KEV RANGE; MEASURING INSTRUMENTS; RADIATION DETECTORS; SPECTROMETERS; SPECTROSCOPY