Published January 2019 | Version v1
Journal article Metadata-only

Development of wide one-dimensional X-ray line sensor in backscatter X-ray imaging system for infrastructure inspection

Creators

  • 1. Nagoya University, Nagoya, Aichi (Japan)
  • 2. National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki (Japan)
  • 3. BEAMX Corporation, Yokohama, Kanagawa (Japan)

Description

We fabricated a wide one-dimensional X-ray line sensor in backscatter X-ray imaging system. The length and width of the sensitive area of our line sensor is 200 mm and 50 mm, respectively. By using fan-beam X-rays and scanning in the perpendicular direction to the fan-beam plane, two-dimensional backscatter X-ray images can be obtained. In basic experiments, we confirmed that an iron rod placed at the depth of, at least, 9 cm in a concrete brock can be seen by combining our line sensor and C-band linac X-ray generator. (author)

Availability note (English)

Available from https://doi.org/10.15669/pnst.6.208

Additional details

Identifiers

DOI
10.15669/pnst.6.208;

Publishing Information

Journal Title
Progress in Nuclear Science and Technology
Journal Volume
6
Journal Page Range
p. 208-211
ISSN
2185-4823

Conference

Title
9. international symposium on radiation safety and detection technology
Acronym
ISORD-9
Dates
10-14 Jul 2017
Place
Nagoya, Aichi (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
50054134
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BACKSCATTERING; BEAM TRANSPORT; BUILDINGS; CADMIUM TUNGSTATES; COLLIMATORS; DATA ACQUISITION; IN-SERVICE INSPECTION; LINEAR ACCELERATORS; OPTICAL FIBERS; RADIATION DETECTORS; X-RAY DETECTION; X-RAY RADIOGRAPHY; X-RAY SOURCES
Descriptors DEC
ACCELERATORS; CADMIUM COMPOUNDS; DATA PROCESSING; DETECTION; FIBERS; INDUSTRIAL RADIOGRAPHY; INORGANIC PHOSPHORS; INSPECTION; MATERIALS TESTING; MEASURING INSTRUMENTS; NONDESTRUCTIVE TESTING; OXYGEN COMPOUNDS; PHOSPHORS; PROCESSING; RADIATION DETECTION; RADIATION SOURCES; REFRACTORY METAL COMPOUNDS; SCATTERING; TESTING; TRANSITION ELEMENT COMPOUNDS; TUNGSTATES; TUNGSTEN COMPOUNDS

Optional Information

Notes
5 refs., 9 figs.