Published May 2015
| Version v1
Journal article
3D visualization of dislocation arrangement using scanning electron microscope serial sectioning method
Description
We performed the three-dimensional visualization of dislocations through serial sectioning and use of SEM electron channeling contrast (ECC) images for a crept nickel-based alloy. We successfully reconstructed a volume of approximately 7.5 μm3, including dislocation arrangements, by performing calculations based on the continuous tomograms of ECC images. By incorporating the information on crystal orientation obtained by the electron back-scattered diffraction, we verified that the three-dimensional arrangement of dislocations, such as slip plane, was accurately reflected in the three-dimensional volume
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2015.02.001Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2015.02.001;
- PII
- S1359-6462(15)00048-2;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 101
- Journal Page Range
- p. 80-83
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47041168
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- APPROXIMATIONS; BACKSCATTERING; CRYSTALS; DISLOCATIONS; ELECTRON CHANNELING; ELECTRON DIFFRACTION; IMAGES; NICKEL BASE ALLOYS; ORIENTATION; SCANNING ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; CALCULATION METHODS; CHANNELING; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; LINE DEFECTS; MICROSCOPY; NICKEL ALLOYS; SCATTERING; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.