Published December 18, 2015 | Version v1
Journal article

A phase-field study of the scaling law in free-standing ferroelectric thin films

  • 1. Department of Engineering Mechanics, and Soft Matter Research Center (SMRC), Zhejiang University, 310027 Hangzhou (China)
  • 2. Department of Aeronautical and Vehicle Engineering, KTH Royal Institute of Technology, SE-100 44 Stockholm (Sweden)

Description

The scaling law for ferroelectric stripe domains is investigated in free-standing BaTiO3 and PbTiO3 thin films via phase-field simulations. The results agree with the Kittel law, where the square of the domain width is found to be proportional to the thin film thickness. After being rescaled by the corresponding domain wall thickness, the generalized scaling law is also demonstrated, with the dimensionless scaling constant M estimated to be ∼3.3 in two ferroelectric materials. Moreover, we predict the effect of the exchange constant which is incorporated in Ginzburg–Landau theory on the equilibrium domain width and the critical thickness of the ferroelectric thin films. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/26/50/505701

Additional details

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
26
Journal Issue
50
Journal Page Range
[8 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48034191
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
EXPERIMENTAL DATA; FERROELECTRIC MATERIALS; GINZBURG-LANDAU THEORY; LEAD COMPOUNDS; SCALING LAWS; THICKNESS; THIN FILMS
Descriptors DEC
DATA; DIELECTRIC MATERIALS; DIMENSIONS; FILMS; INFORMATION; MATERIALS; NUMERICAL DATA