Published December 18, 2015
| Version v1
Journal article
A phase-field study of the scaling law in free-standing ferroelectric thin films
Creators
- 1. Department of Engineering Mechanics, and Soft Matter Research Center (SMRC), Zhejiang University, 310027 Hangzhou (China)
- 2. Department of Aeronautical and Vehicle Engineering, KTH Royal Institute of Technology, SE-100 44 Stockholm (Sweden)
Description
The scaling law for ferroelectric stripe domains is investigated in free-standing BaTiO3 and PbTiO3 thin films via phase-field simulations. The results agree with the Kittel law, where the square of the domain width is found to be proportional to the thin film thickness. After being rescaled by the corresponding domain wall thickness, the generalized scaling law is also demonstrated, with the dimensionless scaling constant M estimated to be ∼3.3 in two ferroelectric materials. Moreover, we predict the effect of the exchange constant which is incorporated in Ginzburg–Landau theory on the equilibrium domain width and the critical thickness of the ferroelectric thin films. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/26/50/505701Additional details
Identifiers
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 26
- Journal Issue
- 50
- Journal Page Range
- [8 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48034191
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- EXPERIMENTAL DATA; FERROELECTRIC MATERIALS; GINZBURG-LANDAU THEORY; LEAD COMPOUNDS; SCALING LAWS; THICKNESS; THIN FILMS
- Descriptors DEC
- DATA; DIELECTRIC MATERIALS; DIMENSIONS; FILMS; INFORMATION; MATERIALS; NUMERICAL DATA