Published August 1976
| Version v1
Journal article
Ionization due to multiple N- and M-shell excitation in penetrating collisions of 0.15--1.20-MeV Xe+ with Xe
Creators
- 1. Department of Physics and The Institute of Materials Science, The University of Connecticut, Storrs, Connecticut 06268
Description
The final charge states of 0.15- to 1.20-MeV Xe+ ions scattered through angles from 1 to 20 deg by single collisions with Xe atoms have been measured. The data show the dependence of multiple N- and M-vacancy production upon the collision's distances of closest approach, which ranges from approximately 0.1 to 0.5 A. The final charge states of those ions scattered to particular angles have average values which range from 1.5 to 16.0 in these collisions
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review A
- Journal Volume
- 14
- Journal Issue
- 2
- Series
- Phys. Rev., A.
- Journal Page Range
- 630-637
- ISSN
- 0556-2791
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 7276275
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ANGULAR DISTRIBUTION; EXCITATION; ION BEAMS; ION-ATOM COLLISIONS; IONIZATION; KEV RANGE 100-1000; MEV RANGE 01-10; XENON; XENON IONS
- Descriptors DEC
- ATOM COLLISIONS; BEAMS; CHARGED PARTICLES; COLLISIONS; DISTRIBUTION; ELEMENTS; ENERGY RANGE; ENERGY-LEVEL TRANSITIONS; ION COLLISIONS; IONS; KEV RANGE; MEV RANGE; NONMETALS; RARE GASES
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent