Component analysis of a mixed beam generated by vacuum electrospray of an ionic liquid
- 1. National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba-shi, Ibaraki-ken 305-8568 (Japan)
Description
Vacuum electrospray of a quaternary ammonium ionic liquid, N,N-diethyl-N-methyl-N-(2-methoxyethyl)ammonium bis(trifluoromethanesulfonyl) amide (DEME-TFSA), was investigated to develop a primary ion source for secondary ion mass spectrometry (SIMS). Since the ionic liquid contains many methyl and ethyl groups as well as protons, its beam is expected to efficiently produce protonated molecules for SIMS analysis of organic materials. Experimental results showed that the beam consisted of charged particles of m/z about 1000 and charged droplets of m/z > 105. The current components of both the charged particles and droplets changed with the applied voltage and the flow rate of the ionic liquid. With decreasing flow rate, the current component of the charged droplets increased, whereas that of the charged particles decreased. The m/z values of the charged droplets diminished with decreasing flow rate and increasing capillary voltage. In addition to masses and charge numbers, the numbers of the charged droplets and the charged particles were estimated.
Additional details
Identifiers
- DOI
- 10.1063/1.3693558;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 111
- Journal Issue
- 6
- Journal Page Range
- p. 064901-064901.7
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43129274
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- AMIDES; DROPLETS; ELECTRIC POTENTIAL; FLOW RATE; ION MICROPROBE ANALYSIS; ION SOURCES; IONS; MASS SPECTRA; MASS SPECTROSCOPY; MOLECULES; MOLTEN SALTS; ORGANIC MATTER; PROTONS
- Descriptors DEC
- BARYONS; CHARGED PARTICLES; CHEMICAL ANALYSIS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; MATTER; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NUCLEONS; ORGANIC COMPOUNDS; ORGANIC NITROGEN COMPOUNDS; PARTICLES; SALTS; SPECTRA; SPECTROSCOPY
Optional Information
- Notes
- (c) 2012 American Institute of Physics