Published July 1996 | Version v1
Journal article

Application of the Doppler tomography to investigation of emission of excited particles relaxing with electron emission

  • 1. Uzhgorodskij Gosudarstvennyj Univ., Uzhgorod (Ukraine)

Description

Generalization of the Doppler tomography (DT) method is performed. Three circuits of highly excited scattered and sputtered particle angular distribution reconstruction under ion bombardment of surface at different angles are developed. The main result of the work consists in the generalization of the DT method for the case of arbitrary bombardment angles for studying the mechanism of formation of excited states of emitted particles, relating both with photon and electron emission. 9 refs

Additional details

Additional titles

Original title (Russian)
Primenenie doplerovskoj tomografii dlya issledovaniya ehmissii vozbuzhdennyk h chastits, relaksiruyushchikh s ispuskaniem ehlektronov

Publishing Information

Journal Title
Izvestiya Akademii Nauk. Rossijskaya Akademiya Nauk. Seriya Fizicheskaya
Journal Volume
60
Journal Issue
7
Journal Page Range
p. 113-120.
ISSN
1026-3489
CODEN
IRAFEO

Conference

Title
12. International conference on interaction of ions with surfaces.
Original Conference Title
12. Mezhdunarodnaya konferentsiya po vzaimodejstviyu ionov s poverkhnost'yu
Dates
Sep 1995.
Place
Zvenigorod (Russian Federation).

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
28044583
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANGULAR DISTRIBUTION; AUGER EFFECT; DOPPLER EFFECT; ELECTRON EMISSION; PHOTON EMISSION; PROTON COMPUTED TOMOGRAPHY; SCATTERING; SECONDARY EMISSION; SPUTTERING
Descriptors DEC
COMPUTERIZED TOMOGRAPHY; DISTRIBUTION; EMISSION; TOMOGRAPHY