Published October 15, 2012 | Version v1
Journal article

Effect of geometrical parameter's uncertainty of BIXS experimental setup for tritium analysis

  • 1. Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang 621900 (China)
  • 2. Key Laboratory of Radiation Physics and Technology of Ministry of Education, Institute of Nuclear Science and Technology, Sichuan University, Chengdu 610064 (China)
  • 3. National X-ray Digital Imaging Instrument Center, Mianyang 621900 (China)

Description

In this paper, the effect of geometrical parameter's uncertainty of experimental setup in β-decay induced X-ray spectroscopy (BIXS) method has been studied. By varying deliberately the distance between the X-ray detector and the sample surface, the change of the tritium content and the tritium depth distribution obtained by the BIXS method has been observed. Both Monte Carlo simulations and experimental measurements were carried out for our BIXS experimental setup. It is found that the BIXS method will not give reliable tritium content and depth distribution of the sample if the sample-detector distance of the experimental setup is not measured accurately, i.e., the deviation of 1 mm of the sample-detector distance will cause ∼10% error of total tritium content besides of the distortion of the shape of tritium depth distribution. This indicates that the geometrical parameters of the experimental setup in the BIXS method must be accurately determined, especially the internal configuration of the X-ray detector used in the BIXS method. The measurement of the internal configuration of an X-ray detector used in the BIXS method by an industrial computed tomography (CT) has been shown in this paper.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2012.08.005

Additional details

Identifiers

DOI
10.1016/j.nimb.2012.08.005;
PII
S0168-583X(12)00491-0;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
289
Journal Page Range
p. 52-55
ISSN
0168-583X
CODEN
NIMBEU

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.