A total-reflection X-ray fluorescence spectrometer using a rotating anode
Creators
- 1. Chalmers Univ. of Tech., Goeteborg (Sweden). Dept. of Phys.
Description
A total-reflection X-ray fluorescence (TXRF) spectrometer has been designed for an 18 kW rotating anode system. The spectrometer uses a multilayer mirror, which is especially advantageous in the analysis of biological samples, and a charge-coupled device (CCD), which is an aid in the alignment of the instrument. To ensure spectrometer stability, the collimator, multilayer mirror and sample holder are connected directly to the housing of the rotating anode while the detector rests on a separate support. With the CCD, the intensity distribution of the X-ray beam was measured; and the beam thickness at the sample position was calculated. A relative sensitivity calibration curve was established for the spectrometer and shown to agree well with a theoretical expression. The calibration was validated by measurements on a certified reference material of plankton. The measurements also provided information about the accuracy, precision and detection limits of the spectrometer for biological samples. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 371
- Journal Issue
- 3
- Journal Page Range
- p. 553-559.
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 27048447
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ACCURACY; ALIGNMENT; ANODES; BEAM MONITORING; BEAM PROFILES; BIOLOGICAL MATERIALS; CALIBRATION; CHARGE-COUPLED DEVICES; COLLIMATORS; MIRRORS; PHOTON BEAMS; PLANKTON; SAMPLE HOLDERS; SENSITIVITY; STABILITY; SUPPORTS; X-RAY FLUORESCENCE ANALYSIS; X-RAY SOURCES; X-RAY SPECTROMETERS; X-RAY TUBES
- Descriptors DEC
- AQUATIC ORGANISMS; BEAMS; CHEMICAL ANALYSIS; ELECTRODES; ELECTRON TUBES; EQUIPMENT; MATERIALS; MEASURING INSTRUMENTS; MECHANICAL STRUCTURES; MONITORING; NONDESTRUCTIVE ANALYSIS; RADIATION SOURCES; SEMICONDUCTOR DEVICES; SPECTROMETERS; X-RAY EMISSION ANALYSIS; X-RAY EQUIPMENT