Published March 1998
| Version v1
Journal article
Dielectric spectroscopy of alumina ceramics over a wide frequency range
Creators
- 1. Centro de Investigaciones Energeticas, Medioambientales y Tecnologicas, Madrid (Spain)
Description
Aluminum oxide (either in single or polycrystalline form) is one of the insulator materials with broad application in high radiation environments. Despite this demanding use, very different values for the dielectric properties have been found in the literature before and after irradiation. In order to obtain a reliable database, the dielectric properties of several unirradiated commercial alumina grades have been measured over a wide frequency (1 kHz to 15 GHz) and temperature range (100 to 300 K). Loss tangent differences over three orders of magnitude have been observed. The possible explanations and the role of some impurities (mainly Mg and Fe) are analyzed. (orig.)
Additional details
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 253
- Journal Page Range
- p. 141-148
- ISSN
- 0022-3115
- CODEN
- JNUMAM
Conference
- Title
- 5. international symposium on fabrication and properties of ceramics for fusion energy and other high radiation environment as part of the 99. annual meeting of the American Ceramics Society
- Dates
- 5-7 May 1997
- Place
- Cincinnati, OH (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 29038642
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM OXIDES; CERAMICS; DIELECTRIC PROPERTIES; ELECTRICAL INSULATORS; FREQUENCY DEPENDENCE; GHZ RANGE 01-100; IMPURITIES; KHZ RANGE; MHZ RANGE; PERMITTIVITY; POROSITY; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0273-0400 K; THERMONUCLEAR REACTOR MATERIALS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; DIELECTRIC PROPERTIES; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; EQUIPMENT; FREQUENCY RANGE; GHZ RANGE; MATERIALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; TEMPERATURE RANGE
Optional Information
- Notes
- 30 refs.