Published February 15, 1982
| Version v1
Journal article
A tomographic gamma-ray scanner for industrial applications
Description
An experimental computerised tomographic (CT) gamma-ray scanner is being developed for the non-destructive testing of industrial objects. A micro-computer controlled traversing system steps the test object across a collimated gamma-ray beam the transmitted intensity of which is measured by a NaI(Tl) detector for a large number of beam paths both through the object and the surrounding air. These data are used to reconstruct an image of the scanned section in terms of a two-dimensional distribution of linear attenuation coefficients at the gamma-ray energy used. A 100 mCi 241AM source of 59.6 keV gamma-rays has been used initially in order to compare the performance with medical CT X-ray scanners. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods Phys. Res.
- Journal Volume
- 193
- Journal Issue
- 1/2
- Series
- Nucl. Instrum. Methods Phys. Res.
- Journal Page Range
- 209-214
- ISSN
- 0029-554X
Conference
- Title
- 5. symposium on x- and gamma-ray sources and applications.
- Dates
- 10 - 12 Jun 1981.
- Place
- Ann Arbor, MI, USA.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 13680684
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATTENUATION; COMPUTERIZED TOMOGRAPHY; GAMMA CAMERAS; KEV RANGE 10-100; MICROPROCESSORS; NAI DETECTORS; NONDESTRUCTIVE TESTING; PHOTON BEAMS; REMOTE CONTROL; TWO-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- BEAMS; CAMERAS; CONTROL; DIAGNOSTIC TECHNIQUES; ELECTRONIC CIRCUITS; ENERGY RANGE; KEV RANGE; MATERIALS TESTING; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; RADIATION DETECTORS; SCINTILLATION COUNTERS; SOLID SCINTILLATION DETECTORS; TESTING; TOMOGRAPHY