Published September 21, 2011 | Version v1
Journal article Metadata-only

A highly adaptive detector system for high resolution neutron imaging

Creators

  • 1. Helmholtz Centre Berlin for Materials and Energy, D-14109 Berlin (Germany)
  • 2. University of Salford, Salford M5 4WT (United Kingdom)
  • 3. University of Heidelberg, D-69120 Heidelberg (Germany)
  • 4. University of Tennessee at Knoxville, Knoxville, TN 37996 (United States)

Description

An optimized detector system that allows high-resolution neutron imaging with desired flexibility is described. The presented system can be adapted and integrated with standard CCD-based neutron detectors. Novel neutron scintillating materials with good photon discrimination and optical lens components are tested and optimized for high-resolution neutron tomographic purposes. The presented detector system provides variable field of view and can be used in combination with different techniques, including dark-field, energy-selective, and neutron spin polarized imaging.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2011.02.084

Additional details

Identifiers

DOI
10.1016/j.nima.2011.02.084;
PII
S0168-9002(11)00481-5;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
651
Journal Issue
1
Journal Page Range
p. 95-99
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
9. world conference on neutron radiography (The Big-5 on Neutron Radiography)
Acronym
WCNR-9
Dates
3-8 Oct 2010
Place
Kwa Maritane (South Africa)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44001711
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGE-COUPLED DEVICES; FLEXIBILITY; NEUTRON DETECTORS; PHOTONS; RESOLUTION; SPIN ORIENTATION
Descriptors DEC
BOSONS; ELEMENTARY PARTICLES; MASSLESS PARTICLES; MEASURING INSTRUMENTS; MECHANICAL PROPERTIES; ORIENTATION; RADIATION DETECTORS; SEMICONDUCTOR DEVICES; TENSILE PROPERTIES

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.