Published January 15, 1987 | Version v1
Journal article Metadata-only

Development of large area silicon detectors

Creators

  • 1. Hamburg Univ. (Germany, F.R.). 1. Inst. fuer Experimentalphysik

Description

Large area totally depleted silicon detectors with a sensitive surface of up to 35 cm2 have been developed for applications in high energy physics with emphasis on electromagnetic and hadronic shower calorimeters. Special fabrication processes and related diode properties, including long-term stability, will be discussed. Special attention is given to edge effects which are investigated with a scanning proton microbeam. The radiation sensitivity of such detectors was extensively studied through capacitance-voltage as well as capacitance-frequency measurements. (orig.)

Additional details

Additional titles

Subtitle (English)
Special properties and radiation stability

Publishing Information

Journal Title
Nucl. Instrum. Methods Phys. Res., Sect. A
Journal Volume
253
Journal Issue
3
Series
Nucl. Instrum. Methods Phys. Res., Sect. A.
Journal Page Range
467-477
ISSN
0168-9002
CODEN
NIMAE

Conference

Title
New developments in radiation detectors.
Acronym
4. European symposium on semiconductor detectors
Dates
3-5 Mar 1986.
Place
Muenchen (Germany, F.R.).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
18032945
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BACKGROUND NOISE; CALORIMETERS; CAPACITANCE; CHARGE COLLECTION; CRYSTAL DEFECTS; FABRICATION; FREQUENCY DEPENDENCE; MEV RANGE 01-10; MEV RANGE 10-100; PHYSICAL RADIATION EFFECTS; POSITION SENSITIVE DETECTORS; PROTON BEAMS; PULSES; SEMICONDUCTOR MATERIALS; SHOWER COUNTERS; SI SEMICONDUCTOR DETECTORS; SILICON; SILICON DIODES; STABILITY; SURFACE BARRIER DETECTORS
Descriptors DEC
BEAMS; CRYSTAL STRUCTURE; ELECTRICAL PROPERTIES; ELEMENTS; ENERGY RANGE; MATERIALS; MEASURING INSTRUMENTS; MEV RANGE; NOISE; NUCLEON BEAMS; PARTICLE BEAMS; PHYSICAL PROPERTIES; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMIMETALS