Published 2010 | Version v1
Journal article

X-radiographical quality and homogeneity studies in GaN layers on silicon

  • 1. Otto-von-Guericke-Universitaet Magdeburg (Germany)
  • 2. AZZURRO Semiconductors AG, Magdeburg (Germany)

Description

no abstract available

Additional details

Additional titles

Original title (German)
Roentgenographische Qualitaets- und Homogenitaetsuntersuchungen an GaN Schichten auf Silizium

Publishing Information

Journal Title
Verhandlungen der Deutschen Physikalischen Gesellschaft
Journal Issue
Regensburg 2010 issue
Series
Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 45(3)
Journal Page Range
[1 p.]
ISSN
0420-0195
CODEN
VDPEAZ

Conference

Title
DPG Spring meeting 2010 of the condensed matter section with the divisions biological physics, chemical and polymer physics, crystallography, dielectric solids, dynamics and statistical physics, low temperature physics, magnetism, metal and material physics, physics of socio-economic systems, radiation and medical physics, semiconductor physics, surface science, thin films, vacuum science and technology as well as the working group industry and business, with job market, symposia, teachers' days, tutorials, exhibition of scientific instruments and literature
Dates
21-26 Mar 2010
Place
Regensburg (Germany)

Optional Information

Notes
Session: HL 27.7 Di 15:30