Published 2010
| Version v1
Journal article
X-radiographical quality and homogeneity studies in GaN layers on silicon
- 1. Otto-von-Guericke-Universitaet Magdeburg (Germany)
- 2. AZZURRO Semiconductors AG, Magdeburg (Germany)
Description
no abstract available
Additional details
Additional titles
- Original title (German)
- Roentgenographische Qualitaets- und Homogenitaetsuntersuchungen an GaN Schichten auf Silizium
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Regensburg 2010 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 45(3)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- DPG Spring meeting 2010 of the condensed matter section with the divisions biological physics, chemical and polymer physics, crystallography, dielectric solids, dynamics and statistical physics, low temperature physics, magnetism, metal and material physics, physics of socio-economic systems, radiation and medical physics, semiconductor physics, surface science, thin films, vacuum science and technology as well as the working group industry and business, with job market, symposia, teachers' days, tutorials, exhibition of scientific instruments and literature
- Dates
- 21-26 Mar 2010
- Place
- Regensburg (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 42040322
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- ALUMINIUM NITRIDES; BEAM OPTICS; GALLIUM NITRIDES; LAYERS; MONOCHROMATORS; PHOTON BEAMS; RADIATION DETECTORS; SILICON; SPATIAL DISTRIBUTION; SPATIAL RESOLUTION; SUBSTRATES; X-RAY DETECTION; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS; X-RAY RADIOGRAPHY; X-RAY TUBES
- Descriptors DEC
- ALUMINIUM COMPOUNDS; BEAMS; COHERENT SCATTERING; DETECTION; DIFFRACTION; DIFFRACTOMETERS; DISTRIBUTION; ELECTRON TUBES; ELEMENTS; EQUIPMENT; GALLIUM COMPOUNDS; INDUSTRIAL RADIOGRAPHY; MATERIALS TESTING; MEASURING INSTRUMENTS; NITRIDES; NITROGEN COMPOUNDS; NONDESTRUCTIVE TESTING; PNICTIDES; RADIATION DETECTION; RESOLUTION; SCATTERING; SEMIMETALS; TESTING; X-RAY EQUIPMENT
Optional Information
- Notes
- Session: HL 27.7 Di 15:30