Performance of high spatial frequency X-ray transmission gratings
Description
The performance of high spatial frequency phased X-ray transmission gratings developed for the High Energy Transmission Grating Spectrometer on the Advanced X-ray Astrophysics FAcility (AXAF) is examined. The gratings tested here nominally consist of 1-micron-thick gold lines of 0.2 micron period covering approximately 5 sq cm of a polyimide membrane. A table-top setup at MIT employs the gratings in reflection to diffract UV (325 nm) laser light. It is used to measure grating periods and indicates that period variations within and between gratings are a few parts in 10,000. Tests performed at the Marshall Space Flight Center 304 m X-ray Facility using 1.5 keV X-rays in transmission corroborate the UV measurements and demonstrate geometrically-limited resolving powers of E/Delta E about 750. Finally, X-ray transmission tests performed in the MIT 25 m X-ray facility provide measurements of period, line thickness, space-to-period ratio, tilt of grating lines, and efficiency. 9 refs
Additional details
Publishing Information
- Publisher
- Society of Photo-Optical Instrumentation Engineers.
- Imprint Place
- Bellingham, WA (USA)
- Imprint Title
- X-ray instrumentation in astronomy II; Proceedings of the Meeting, San Diego, CA, Aug. 15-17, 1988
- Imprint Pagination
- 432 p.
- Journal Page Range
- p. 273-282.
Conference
- Title
- X-ray instrumentation in astronomy II.
- Dates
- 15-17 Aug 1988.
- Place
- San Diego, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21004300
- Subject category
- S79: ASTROPHYSICS, COSMOLOGY AND ASTRONOMY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ASTRONOMY; ASTROPHYSICS; LASERS; PERFORMANCE; PERFORMANCE TESTING; ULTRAVIOLET RADIATION; X-RAY DETECTION; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
- Descriptors DEC
- AMPLIFIERS; DETECTION; ELECTROMAGNETIC RADIATION; EQUIPMENT; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATIONS; SPECTROMETERS; SPECTROSCOPY; TESTING
Optional Information
- Secondary number(s)
- CONF-8808210--.