Published 1988 | Version v1
Book

Performance of high spatial frequency X-ray transmission gratings

Description

The performance of high spatial frequency phased X-ray transmission gratings developed for the High Energy Transmission Grating Spectrometer on the Advanced X-ray Astrophysics FAcility (AXAF) is examined. The gratings tested here nominally consist of 1-micron-thick gold lines of 0.2 micron period covering approximately 5 sq cm of a polyimide membrane. A table-top setup at MIT employs the gratings in reflection to diffract UV (325 nm) laser light. It is used to measure grating periods and indicates that period variations within and between gratings are a few parts in 10,000. Tests performed at the Marshall Space Flight Center 304 m X-ray Facility using 1.5 keV X-rays in transmission corroborate the UV measurements and demonstrate geometrically-limited resolving powers of E/Delta E about 750. Finally, X-ray transmission tests performed in the MIT 25 m X-ray facility provide measurements of period, line thickness, space-to-period ratio, tilt of grating lines, and efficiency. 9 refs

Additional details

Publishing Information

Publisher
Society of Photo-Optical Instrumentation Engineers.
Imprint Place
Bellingham, WA (USA)
Imprint Title
X-ray instrumentation in astronomy II; Proceedings of the Meeting, San Diego, CA, Aug. 15-17, 1988
Imprint Pagination
432 p.
Journal Page Range
p. 273-282.

Conference

Title
X-ray instrumentation in astronomy II.
Dates
15-17 Aug 1988.
Place
San Diego, CA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
21004300
Subject category
S79: ASTROPHYSICS, COSMOLOGY AND ASTRONOMY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ASTRONOMY; ASTROPHYSICS; LASERS; PERFORMANCE; PERFORMANCE TESTING; ULTRAVIOLET RADIATION; X-RAY DETECTION; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
Descriptors DEC
AMPLIFIERS; DETECTION; ELECTROMAGNETIC RADIATION; EQUIPMENT; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATIONS; SPECTROMETERS; SPECTROSCOPY; TESTING

Optional Information

Secondary number(s)
CONF-8808210--.