Published July 1, 1997
| Version v1
Journal article
Real-time x-ray scattering studies of thin-film growth and processing
Creators
- 1. Cornell High Energy Synchrotron Source, Cornell University, Ithaca, New York 14853 (United States)
Description
no abstract available
Additional details
Identifiers
- DOI
- 10.1063/1.54586;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 417
- Journal Issue
- 1
- Journal Page Range
- p. 195
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 10. United States national conference on synchrotron radiation instrumentation
- Dates
- 17-20 Jun 1997
- Place
- Ithaca, NY (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40053720
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- CRYSTAL GROWTH; CRYSTAL STRUCTURE; PROCESSING; SYNCHROTRON RADIATION SOURCES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; FILMS; RADIATION SOURCES; SCATTERING
Optional Information
- Notes
- (c) 1997 American Institute of Physics