Published December 14, 2014
| Version v1
Journal article
Magnetoresistance of Au films
- 1. Institute of Physics, Chinese Academy of Sciences, Beijing 10081 (China)
- 2. Center for Nanophase Materials Sciences and Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6493 (United States)
- 3. Department of Physics and Quantum Theory Project, University of Florida, Gainesville, Florida 32611 (United States)
Description
Classical magnetoresistance (MR) in nonmagnetic metals are conventionally understood in terms of the Kohler rule, with violation usually viewed as anomalous electron transport, in particular, as evidence of non-Fermi liquid behavior. Measurement of the MR of Au films as a function of temperature and film thickness reveals a strong dependence on grain size distribution and clear violation of the Kohler rule. Using a model of random resistor network, we show that this result can be explained if the MR arises entirely from inhomogeneity due to grain boundary scattering and thermal activation of grain boundary atoms. Consequently, the Kohler rule should not be used to distinguish normal and anomalous electron transport in solids
Additional details
Identifiers
- DOI
- 10.1063/1.4903953;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 116
- Journal Issue
- 22
- Journal Page Range
- p. 223704-223704.6
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46108524
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ATOMS; DISTRIBUTION; ELECTRONS; FERMI GAS; FILMS; GRAIN BOUNDARIES; GRAIN SIZE; MAGNETORESISTANCE; METALS; RANDOMNESS; RESISTORS; SCATTERING; SOLIDS; TEMPERATURE DEPENDENCE; THICKNESS
- Descriptors DEC
- DIMENSIONS; ELECTRIC CONDUCTIVITY; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; ELEMENTS; EQUIPMENT; FERMIONS; LEPTONS; MICROSTRUCTURE; PHYSICAL PROPERTIES; SIZE
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC