Published February 28, 2011 | Version v1
Journal article

Plasmon resonance shift during grazing incidence ion sputtering on Ag(001)

Description

Grazing incidence ion sputtering was used to create shallow ripple patterns on a Ag(001) surface. The anisotropic plasmon resonance associated with this ripple pattern can be sensitively measured with Reflection Anisotropy Spectroscopy. A slight red shift of the resonance energy is observed with increasing ion fluence. The observed resonance feature is described well with a skewed Lorentzian line shape. This line shape is the small roughness length scale limit of the Rayleigh Rice perturbation approach. The width of this line shape is directly related to imaginary part of the dielectric function, which shows a roughness induced reduction of the electron mean free path. The observed change in resonance energy and strength with ion fluence is discussed.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2010.12.045

Additional details

Identifiers

DOI
10.1016/j.tsf.2010.12.045;
PII
S0040-6090(10)01675-5;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
519
Journal Issue
9
Journal Page Range
p. 2664-2667
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
5. international conference on spectroscopic ellipsometry
Dates
23-28 May 2010
Place
Albany, NY (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42072123
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANISOTROPY; DIELECTRIC MATERIALS; ION BEAMS; MEAN FREE PATH; PERTURBATION THEORY; RED SHIFT; REFLECTION; RESONANCE; SILVER; SPECTROSCOPY; SPUTTERING; SURFACES
Descriptors DEC
BEAMS; ELEMENTS; MATERIALS; METALS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.