Published June 1981 | Version v1
Journal article

Tunneling spectroscopy in thin films of vanadium

Description

Vanadium-lead tunnel junctions with vanadium oxide, carbon, and silicon barriers have been studied. Junction characteristics for V--Si--Pb are nearly ideal and yield a ratio 2Δ/sub V/(0)/kT/sub c/ which agrees with BCS theory. The ratio is less for the other junctions. Features due to peaks in the phonon spectrum of vanadium were not observed in the V--Si--Pb junction characteristics, which may be explained by the hypothesis of a thin normal layer on the vanadium surface

Additional details

Publishing Information

Journal Title
Sov. Phys. - Solid State (Engl. Transl.)
Journal Volume
23
Journal Issue
6
Series
Sov. Phys. - Solid State (Engl. Transl.).
Journal Page Range
932-935

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
13702325
Subject category
S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
BCS THEORY; CARBON; CORRELATIONS; ELECTRIC CONDUCTIVITY; EXPERIMENTAL DATA; FILMS; LEAD; PHONONS; SPECTROSCOPY; SUPERCONDUCTING JUNCTIONS; SUPERCONDUCTORS; TUNNEL EFFECT; VANADIUM
Descriptors DEC
DATA; ELECTRICAL PROPERTIES; ELEMENTS; INFORMATION; METALS; NONMETALS; NUMERICAL DATA; PHYSICAL PROPERTIES; QUASI PARTICLES; TRANSITION ELEMENTS