Published June 1981
| Version v1
Journal article
Tunneling spectroscopy in thin films of vanadium
Creators
Description
Vanadium-lead tunnel junctions with vanadium oxide, carbon, and silicon barriers have been studied. Junction characteristics for V--Si--Pb are nearly ideal and yield a ratio 2Δ/sub V/(0)/kT/sub c/ which agrees with BCS theory. The ratio is less for the other junctions. Features due to peaks in the phonon spectrum of vanadium were not observed in the V--Si--Pb junction characteristics, which may be explained by the hypothesis of a thin normal layer on the vanadium surface
Additional details
Publishing Information
- Journal Title
- Sov. Phys. - Solid State (Engl. Transl.)
- Journal Volume
- 23
- Journal Issue
- 6
- Series
- Sov. Phys. - Solid State (Engl. Transl.).
- Journal Page Range
- 932-935
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 13702325
- Subject category
- S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- BCS THEORY; CARBON; CORRELATIONS; ELECTRIC CONDUCTIVITY; EXPERIMENTAL DATA; FILMS; LEAD; PHONONS; SPECTROSCOPY; SUPERCONDUCTING JUNCTIONS; SUPERCONDUCTORS; TUNNEL EFFECT; VANADIUM
- Descriptors DEC
- DATA; ELECTRICAL PROPERTIES; ELEMENTS; INFORMATION; METALS; NONMETALS; NUMERICAL DATA; PHYSICAL PROPERTIES; QUASI PARTICLES; TRANSITION ELEMENTS