Published March 2016 | Version v1
Journal article

Detection of short ssDNA and dsDNA by current-voltage measurements using conical nanopores coated with Al2O3 by atomic layer deposition

  • 1. Department of Applied Science and Technology, AC Tech, Anna University, Chennai, 600025 (India)
  • 2. Institut Européen des Membranes, IEM UMR-5635, Université de Montpellier, ENSCM, CNRS, Place Eugène Bataillon, 34095, Montpellier (France)
  • 3. Institut des Biomolécules Max Mousseron, IBMM UMR5247 Université de Montpellier, ENSCM, CNRS, Place Eugène Bataillon, Montpellier (France)
  • 4. Centre de recherche sur les Ions, les Matériaux et la Photonique, UMR6252 CEA-CNRS-ENSICAEN, 6 Boulevard du Maréchal Juin, 14050 Cedex 4, Caen (France)

Description

DNA detection using solid state nanopores is limited by the difficulty of the detection of short DNA strands due to their very short dwell time. Here, we report on the fabrication of nanopores using a track-etching technique along with the atomic layer deposition of aluminum oxide. This method allows shaping of conical nanopores, controlling their diameter, and passivation of the surface by Al2O3. Through the optimized nanopore, short DNA (10 nM) having 10 and 40 nucleotides in length were detected both at the single stranded and double stranded levels. The analysis of current trace shows signal to noise ratio of 2 and 4 for ssDNA and dsDNA respectively and a dwell time at ms scale. This is possible because of both the high aspect ratio and the Al2O3 coating that permit to decrease the DNA velocity. (author)

Additional details

Identifiers

Publishing Information

Journal Title
Microchimica Acta (Online)
Journal Volume
183
Journal Issue
3
Journal Page Range
p. 1011-1017
ISSN
1436-5073