Published December 15, 2007 | Version v1
Journal article

Characterization of donor states in ZnO

  • 1. Science Institute, University of Iceland, Dunhagi 3, IS-107 Reykjavik (Iceland)

Description

We performed electrical and optical measurements on as-grown ZnO which exhibits n-type conductivity. So far, neither the origin of the residual conductivity nor the electrical properties of the responsible defects is fully understood. We investigated shallow and deep donors in ZnO materials grown with pulsed laser injection using admittance spectroscopy. We identifed shallow donors with ionization energies as low as 15 meV which may be attributed to native defects. Annealing in nitrogen ambient enhances the conductivity by further lowering the ionization energy of the shallow donors. Using optically excited admittance spectroscopy we also found deep defects. They are strongly metastable and account for a significant part of the persistent photoconductivity in our ZnO materials

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physb.2007.08.198

Additional details

Identifiers

DOI
10.1016/j.physb.2007.08.198;
PII
S0921-4526(07)00743-0;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
401-402
Journal Page Range
p. 404-407
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
24. International conference on defects in semiconductors
Dates
22-27 Jul 2007
Place
Albuquerque, NM (United States)

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.