Characterization of donor states in ZnO
Creators
- 1. Science Institute, University of Iceland, Dunhagi 3, IS-107 Reykjavik (Iceland)
Description
We performed electrical and optical measurements on as-grown ZnO which exhibits n-type conductivity. So far, neither the origin of the residual conductivity nor the electrical properties of the responsible defects is fully understood. We investigated shallow and deep donors in ZnO materials grown with pulsed laser injection using admittance spectroscopy. We identifed shallow donors with ionization energies as low as 15 meV which may be attributed to native defects. Annealing in nitrogen ambient enhances the conductivity by further lowering the ionization energy of the shallow donors. Using optically excited admittance spectroscopy we also found deep defects. They are strongly metastable and account for a significant part of the persistent photoconductivity in our ZnO materials
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2007.08.198Additional details
Identifiers
- DOI
- 10.1016/j.physb.2007.08.198;
- PII
- S0921-4526(07)00743-0;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 401-402
- Journal Page Range
- p. 404-407
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 24. International conference on defects in semiconductors
- Dates
- 22-27 Jul 2007
- Place
- Albuquerque, NM (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39051749
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; CRYSTAL DEFECTS; ELECTRICAL PROPERTIES; ENERGY LEVELS; INJECTION; IONIZATION; METASTABLE STATES; MEV RANGE; N-TYPE CONDUCTORS; NITROGEN; PHOTOCONDUCTIVITY; SPECTROSCOPY; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; ENERGY LEVELS; ENERGY RANGE; EXCITED STATES; HEAT TREATMENTS; INTAKE; MATERIALS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SEMICONDUCTOR MATERIALS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.