Structural, magnetic and dielectric properties of Y doped BiFeO3
- 1. School of Materials Science and Engineering, Shanghai University, Shanghai, 200072 (China)
- 2. Department of Physics, National Institute of Technology, Warangal, 506002 (India)
- 3. Departmant of Physics, Osmania University, Hyderabad, 500 007 (India)
- 4. Vidya Jyothi Institute of Technology, Aziz Nagar Gate, C.B. Post, Hyderabad, 500075 (India)
Description
With a view to understand the influence of doping Bismuth ferrite with Yttrium on structural, magnetic and dielectric behavior, a series of samples were prepared by the solid state reaction technique. After characterizing the samples with XRD and SEM studies, magnetic and dielectric measurements were carried out. The impurity phase of Bismuth ferrite is found to disappear with increasing Y doping concentration and finally the sample with x = 0.2 is found to be free from secondary phases. The dielectric constant is also found to exhibit two transitions and efforts were made to explain the observed behavior. - Highlights: • The doping of Y helped in reducing the impurity phase of BiFeO3. • All the Y doped samples are found to exhibit peaks in magnetization. • Y doped BFO might be considered for future device applications.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchemphys.2016.01.047Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2016.01.047;
- PII
- S0254-0584(16)30047-5;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 173
- Journal Page Range
- p. 126-131
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48021539
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CONCENTRATION RATIO; DIELECTRIC MATERIALS; DOPED MATERIALS; FERRITES; IMPURITIES; MAGNETIC PROPERTIES; MAGNETIZATION; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION; YTTRIUM
- Descriptors DEC
- COHERENT SCATTERING; DIELECTRIC PROPERTIES; DIFFRACTION; DIMENSIONLESS NUMBERS; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; FERRIMAGNETIC MATERIALS; IRON COMPOUNDS; MAGNETIC MATERIALS; MATERIALS; METALS; MICROSCOPY; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.