Two dimensional MoS2/graphene p-n heterojunction diode: Fabrication and electronic characteristics
Creators
- 1. Graduate Institute of Electro-Optical Engineering, National Taiwan University of Science and Technology, 43, Section 4, Keelung Road, Taipei 10607, Taiwan (China)
- 2. Department of Electronic and Computer Engineering, National Taiwan University of Science and Technology, 43, Section 4, Keelung Road, Taipei 10607, Taiwan (China)
- 3. Department of Electronic Engineering, Ming Chi University of Technology, 84 Gungjuan Road, New Taipei City 24301, Taiwan (China)
Description
Molybdenum disulfide (MoS2) films are currently the most potential semiconductor materials of the two-dimensional nano-material heterojunction. Few-layer MoS2 is an n-type semiconductor that has good mechanical strength, high carrier mobility, and has similar thickness as graphene. Graphene is presently the thinnest two-dimensional material with good thermal conductivity and high carrier mobility. The graphene Fermi level can be precisely controlled using the oxygen adsorption. Therefore, graphene can be tuned from zero-gap to p-type semiconductor material using the amount of adsorbed oxygen. In this study we combine few-layer MoS2 and graphene to produce a heterojunction and exhaustively study the interface properties for heterojunction diode application. According to the results, the MoS2 band-gap increases with decreasing thickness. The I–V characteristics of the MoS2/Graphene p-n junction diodes can be precisely tuned by adjusting different thicknesses of the MoS2 films. By applying our fabricating method, MoS2/Graphene heterojunction diode can be easily constructed and have potential to different applications. - Highlights: • We controlled the layer thickness of MoS2 by different exfoliation times. • We presented Raman scattering of MoS2 and define their layers number. • The few-layer MoS2/graphene pn junction diode was synthesized. • We measured the device current and voltage characteristics. • The built-in potential barrier could be adjusted by controlling MoS2 thicknesses.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2016.02.053Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2016.02.053;
- PII
- S0925-8388(16)30322-X;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 671
- Journal Page Range
- p. 276-282
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48060034
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ADSORPTION; CARRIER MOBILITY; CARRIERS; ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; FERMI LEVEL; FILMS; GRAPHENE; HETEROJUNCTIONS; INTERFACES; LAYERS; MOLYBDENUM SULFIDES; P-N JUNCTIONS; RAMAN EFFECT; SEMICONDUCTOR MATERIALS; SILICON OXIDES; THERMAL CONDUCTIVITY; THICKNESS; TWO-DIMENSIONAL SYSTEMS
- Descriptors DEC
- CARBON; CHALCOGENIDES; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIMENSIONS; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELEMENTS; ENERGY LEVELS; EQUIPMENT; MATERIALS; MOBILITY; MOLYBDENUM COMPOUNDS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; SEMICONDUCTOR JUNCTIONS; SILICON COMPOUNDS; SORPTION; SULFIDES; SULFUR COMPOUNDS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.