A new Diffractometer for Studies of Liquid-Liquid Interfaces
Creators
- 1. IEAP, Christian-Albrechts-Universitaet zu Kiel, D-24098 Kiel (Germany)
- 2. PETRA III at DESY, Notkestr. 85, D-22603 Hamburg (Germany)
Description
We have designed a novel, dedicated diffractometer for surface x-ray scattering studies of liquid-liquid and liquid-gas interfaces for the PETRA III High Resolution Diffraction Beamline. Using a double crystal beam-tilter in Bragg geometry this new instrument enables reflectivity and grazing incidence diffraction investigations without moving the sample, which is mechanically decoupled from the rest of the diffractometer. This design minimizes external excitation of surface vibrations, a key prerequisite for studies of liquid interfaces. The instrument operates over the energy range 6.4 keV to 30 keV, the higher energy range being optimal for penetration through liquid sample environments. Vertical momentum transfer up to qz 2.5 A-1 and lateral q|| up to 4 A-1will be available.
Additional details
Identifiers
- DOI
- 10.1063/1.3463163;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1234
- Journal Issue
- 1
- Journal Page Range
- p. 155-158
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 10. international conference on radiation instrumentation
- Acronym
- SRI 2009
- Dates
- 27 Sep - 2 Oct 2009
- Place
- Melbourne (Australia)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42003379
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAMS; CRYSTALS; DESIGN; DIFFRACTOMETERS; ENVIRONMENT; EXCITATION; INTERFACES; KEV RANGE; LIQUIDS; MOMENTUM TRANSFER; REFLECTIVITY; RESOLUTION; SURFACES; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ENERGY RANGE; ENERGY-LEVEL TRANSITIONS; FLUIDS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SCATTERING; SURFACE PROPERTIES
Optional Information
- Notes
- (c) 2010 American Institute of Physics