Published November 1991 | Version v1
Journal article

Microstructure and microwave properties of YBCO thin films grown on MgO and SrTiO3 by CVD

  • 1. Superconductor Technologies Inc., 460-F Ward Drive, Santa Barbara, California (USA)
  • 2. Department of Electronics, Nagaoka University of Technology, Nagaoka, Niigata 940-21 (Japan)
  • 3. Institute for Materials Research, Tohoku University, Sendai, Miyagi 980 (Japan)
  • 4. Technological Research Center, Riken Corporation, Kumagaya 810, Saitama 360 (Japan)
  • 5. Department of Physics, University of California-Los Angeles, Los Angeles, California (USA)

Description

The microstructure and microwave properties of YBa2Cu3O7-δ thin films grown on SrTiO3 (100) and MgO (100) substrates by chemical vapor deposition have been studied. Both 100 GHz cavity measurement of surface resistance and ground plane substitution in a 5 GHz microstrip resonator show that films on SrTiO3 have better microwave properties than those on MgO. Although there are some a-axis grains and secondary phases on the surface, a large fraction of each film on SrTiO3 is epitaxial with its c axis normal to the substrate. The 100 GHz surface resistance of these films is less than copper for temperature ≤82 K, and approaches the detection limit at 10--20 K. For the films on MgO, c-axis grains of different in-plane rotation are found together with some a-axis needle-like grains. The grain boundaries are detrimental to the microwave properties, and the resulting surface resistance at 100 GHz and 10--20 K is about 20 mΩ higher than that of films on SrTiO3

Additional details

Publishing Information

Journal Title
Journal of Materials Research
Journal Volume
6
Journal Issue
11
Series
J. Mater. Res.
Journal Page Range
2259-2263
ISSN
0884-2914
CODEN
JMREE