Published October 2006 | Version v1
Journal article Metadata-only

Developed of a Multi-Degree of Freedoms Measuring System and an Error Compensation Technique for Machine Tools

Creators

  • 1. Institute of Mechanical and Electro-Mechanical Engineering, National Formosa University, Taiwan, 632 (China)
  • 2. Graduate Institute of Electro-Optical and Materials Science, National Formosa University, Taiwan, 632 (China)
  • 3. Department of Computer Science and Information Engineering, National Formosa University, Yunlin, Taiwan, 632 (China)
  • 4. Department of Mechanical Engineering, National Chung-Cheng University, Chiayi, Taiwan, 621 (China)

Description

In this paper, a new measuring system, Multi-Degree of Freedoms Measuring System(MDFMS), is presented. It is integrated a miniature laser interferometer with a DVD pickup and straightness measuring optical system. The five-degrees of freedoms motion errors to simultaneously measure machine tools. And, it reduces the overall time for measuring the geometric errors. The resolution and accuracy of straightness measurement are about 0.3μm and the resolution and accuracy of the angular error measurement are about 0.6arcsecs within the measuring range of 150mm. MDFMS is characteristic by simple set up, low cost, fast measuring and high accuracy for machine tools

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/48/761/jpconf6_48_144.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Identifiers

URL
http://stacks.iop.org/1742-6596/48/761/jpconf6_48_144.pdf; http://www.iop.org/;
DOI
10.1088/1742-6596/48/1/144;

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
48
Journal Issue
1
Journal Page Range
p. 761-765
ISSN
1742-6596

Conference

Title
International symposium on instrumentation science and technology
Dates
8-12 Aug 2006
Place
Harbin (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38033710
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; DEGREES OF FREEDOM; ERRORS; INTERFEROMETERS; LASERS; MACHINE TOOLS; OPTICAL SYSTEMS; RESOLUTION
Descriptors DEC
EQUIPMENT; MEASURING INSTRUMENTS; TOOLS