Published March 22, 2013
| Version v1
Journal article
X-ray Raman scattering: An exciting tool for the study of matter at conditions of the Earth's interior
Creators
- 1. Fakultät Physik/DELTA, Technische Universität Dortmund, D-44227 Dortmund (Germany)
- 2. Deutsches GeoForschungszentrum GFZ, D-14473 Potsdam (Germany)
- 3. European Synchrotron Radiation Facility ESRF, Grenoble (France)
Description
The study of minerals and melts at in situ conditions is highly relevant to understand the physical and chemical properties of the Earth's crust and mantle. Here, x-ray Raman scattering provides a valuable tool to investigate the local atomic and electronic structure of Earth materials consisting predominantly of low Z elements at high pressures and temperatures. The capabilities of x-ray Raman scattering to investigate silicate minerals, glasses, and melts are discussed and the application of the method to in situ studies of silicate melts using a hydrothermal diamond anvil cell is demonstrated.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/425/20/202011Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 425
- Journal Issue
- 20
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 11. international conference on synchrotron radiation instrumentation
- Acronym
- SRI 2012
- Dates
- 9-13 Jul 2012
- Place
- Lyon (France)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44119583
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHEMICAL PROPERTIES; DIAMONDS; EARTH CRUST; ELECTRONIC STRUCTURE; GLASS; RAMAN EFFECT; SILICATE MINERALS; SILICATES; TOOLS; X RADIATION
- Descriptors DEC
- CARBON; ELECTROMAGNETIC RADIATION; ELEMENTS; EQUIPMENT; IONIZING RADIATIONS; MINERALS; NONMETALS; OXYGEN COMPOUNDS; RADIATIONS; SILICON COMPOUNDS