Published 1990 | Version v1
Book

High quality Yba2Cu3O7-x thin films prepared by plasma-enhanced metalorganic chemical vapor deposition

  • 1. Rutgers--the State Univ., Piscataway, NJ (USA)
  • 2. EMCORE Corp., Somerset, NJ (USA)
  • 3. Stevens Inst. of Tech., Hoboken, NJ (USA)

Description

The authors have grown YBa2Cu3O7-x superconducting thin films epitaxially, in-situ, by a microwave-plasma enhanced metalorganic chemical vapor deposition process. The films had smooth mirror-like surfaces and were deposited at a substrate temperature of 730 degree C in 2 torr of N2O partial pressure. LaAlO3 and SrTiO3 were selected as the substrate materials because of their close lattice match to YBa2Cu3O7-x. Electrical resistance versus temperature measurements of the as deposited films show normal metallic behavior and sharp superconducting transitions with Tc(R = 0) ∼89K. Critical current densities measured on patterned bridges were 5 x 105 A/cm2 at 78K for the films on LaAlO3 and SrTiO3, respectively. X-ray diffraction measurements indicate that films grew epitaxially in the plane of the substrate with c-axis perpendicular to the substrate surface

Additional details

Publishing Information

Publisher
Materials Research Society.
Imprint Place
Pittsburgh, PA (USA)
ISBN
1-55899-092-5
Imprint Title
Proceedings of the second international conference on electronic materials
Imprint Pagination
664 p.
Journal Page Range
p. 5-10.

Conference

Title
2nd international conference on electronic materials.
Acronym
ICEM '90
Dates
17-19 Sep 1990.
Place
Newark, NJ (USA).

Optional Information

Secondary number(s)
CONF-900935--.