Published December 1, 2015
| Version v1
Journal article
X-ray fluorescence holography studies for a Cu3Au crystal
Description
In this work we show that performing a numerical correction for beam attenuation and indirect excitation allows one to fully restore element sensitivity in the three-dimensional reconstruction of the atomic structure. This is exemplified by a comparison of atomic images reconstructed from holograms measured for ordered and disordered phases of a Cu3Au crystal that clearly show sensitivity to changes in occupancy of the atomic sites. Moreover, the numerical correction, which is based on quantitative methods of X-ray fluorescence spectroscopy, was extended to take into account the influence of a disturbed overlayer in the sample.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2015.05.035Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2015.05.035;
- PII
- S0168-583X(15)00530-3;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 364
- Journal Page Range
- p. 136-141
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 12. international school and symposium on synchrotron radiation in natural science
- Acronym
- ISSRNS 2014
- Dates
- 15-20 Jun 2014
- Place
- Mazovia (Poland)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48011421
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATTENUATION; BEAMS; COMPARATIVE EVALUATIONS; COPPER; CRYSTALS; EXCITATION; FLUORESCENCE; GOLD; HOLOGRAPHY; IMAGES; LAYERS; MONOCHROMATIC RADIATION; QUANTITATIVE CHEMICAL ANALYSIS; SENSITIVITY; THREE-DIMENSIONAL CALCULATIONS; X RADIATION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SOURCES
- Descriptors DEC
- CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; ENERGY-LEVEL TRANSITIONS; EVALUATION; IONIZING RADIATIONS; LUMINESCENCE; METALS; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; RADIATION SOURCES; RADIATIONS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.