Dielectronic recombination measurements of highly-charged heliumlike and neonlike ions using an electron beam ion trap

The electron beam ion trap (EBIT) at LLNL is a unique device designed to measure the interactions of electrons with highly-charged ions. We describe three methods used at EBIT to directly measure the dielectronic recombination (DR) process: the intensity of the stabilizing x-rays is measured as a function of electron beam energy; the ions remaining in a particular ionization state are counted after the electron beam has been held at a fixed electron energy for a fixed time; and high-resolution spectroscopy is used to resolve individual DR satellite lines. In our discussions, we concentrate on the KLL resonances of the heliumlike target ions (V21+ to Ba54+), and the LMM resonances of the neonlike target ions (Xe44+ to Th80+). 12 refs., 8 figs