Enhanced ferroelectric properties and crystal structure of TGS0.74P0.26 single crystals
- 1. DRDO-BU Center for Life Sciences, Bharathiar University Campus, Crystal Growth Laboratory, Physics Division (India)
Description
The single crystals of triglycine sulpho phosphate (TGS0.74P0.26) were grown by slow evaporation method with 0.6 M of phosphoric acid in the growth solution. The crystal structure of the grown crystal is refined with 0.74 sulphur and 0.26 phosphorous occupancy with the formula of TGS0.74P0.26 using single crystal x-ray diffraction analysis. The dielectric, ferroelectric and pyroelectric properties of the TGS0.74P0.26 single crystals were investigated. The coercive field (Ec) and internal bias field (Ib) values are 8 kV/cm and 1.4 kV/cm, respectively and these values are found increased compared to the pure TGS and also low dielectric loss was observed. The pyroelectric coefficient of TGS0.74P0.26 crystal is 0.023 µC/cm2/°C and the pyroelectric figure of merit for current, voltage and detectivity are Fi = 105 pm/V, Fv = 0.055 m2/C and Fd = 22 µPa−1/2 respectively. Enhanced ferroelectric properties were observed when compared to the pure TGS crystals. The figure of merit for the detectivity (Fd) shows higher values when compared with that of the well-known materials such as PZT (11.5 µPa−1/2) and other lead free materials such as SBN (7.21 µPa−1/2) and CSBN (12 µPa−1/2). With these excellent properties, the TGS0.74P0.26 single crystal can be a promising material for the pyroelectric detector applications.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science. Materials in Electronics
- Journal Volume
- 30
- Journal Issue
- 17
- Journal Page Range
- p. 16494-16501
- ISSN
- 0957-4522
- CODEN
- JSMEEV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52024051
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTAL GROWTH; CRYSTAL STRUCTURE; CRYSTALLIZATION; FERROELECTRIC MATERIALS; MONOCRYSTALS; PHOSPHORIC ACID; PYROELECTRIC DETECTORS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTALS; DIELECTRIC MATERIALS; DIFFRACTION; HYDROGEN COMPOUNDS; INORGANIC ACIDS; INORGANIC COMPOUNDS; MATERIALS; MEASURING INSTRUMENTS; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHOSPHORUS COMPOUNDS; RADIATION DETECTORS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature