Copper ion implantation of polycarbonate matrices: Morphological and structural properties
Creators
Description
The implantation of 1 MeV 63Cu+ ions in polycarbonate (PC) matrices has been carried out in order to evaluate the morphological and structural modifications induced in the polymer as a function of the ion fluence in the range 5 × 1013 ions cm−2 to 1 × 1017 ions cm−2. Atomic Force Microscopy analysis reveals a significant roughness increase of the polymer surface only for fluences higher than 5 × 1016 ions cm−2 with the presence of hillock structures which surface density increases with increasing the ion fluence. X-ray Diffraction measurements of PC implanted with fluences in the range between 5 × 1015 at cm−2 and 5 × 1016 at cm−2 reveal an increase of the disorder inside the PC matrix, as a consequence of the damaging process induced by the ion irradiation. Evidences about the presence of exotic phase structures ascribed to both cubic Cu2O and cubic Cu have been found
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2013.11.033Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2013.11.033;
- PII
- S0168-583X(14)00119-0;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 331
- Journal Page Range
- p. 187-190
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 11. European conference on accelerators in applied research and technology
- Dates
- 8-13 Sep 2013
- Place
- Namur (Belgium)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46128909
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CARBONIZATION; COPPER 63; COPPER IONS; COPPER OXIDES; DENSITY; ION IMPLANTATION; IRRADIATION; MATRICES; METALS; MEV RANGE 01-10; MORPHOLOGY; POLYCARBONATES; ROUGHNESS; SURFACES; X-RAY DIFFRACTION
- Descriptors DEC
- CARBON COMPOUNDS; CARBONATES; CHALCOGENIDES; CHARGED PARTICLES; CHEMICAL REACTIONS; COHERENT SCATTERING; COPPER COMPOUNDS; COPPER ISOTOPES; DECOMPOSITION; DIFFRACTION; ELEMENTS; ENERGY RANGE; INTERMEDIATE MASS NUCLEI; IONS; ISOTOPES; MEV RANGE; MICROSCOPY; NUCLEI; ODD-EVEN NUCLEI; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; POLYMERS; SCATTERING; STABLE ISOTOPES; SURFACE PROPERTIES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.