Published March 2012 | Version v1
Journal article

Temperature driven evolution of thermal, electrical, and optical properties of Ti–Al–N coatings

  • 1. Christian Doppler Laboratory for Application Oriented Coating Development, Department of Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef-Strasse 18, A-8700 Leoben (Austria)
  • 2. Department Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef-Strasse 18, A-8700 Leoben (Austria)
  • 3. Spectral Energies LLC, Suite 301, 5100 Springfield Street, Dayton, OH 45431 (United States)
  • 4. Air Force Research Laboratory, Materials and Manufacturing Directorate, Thermal Sciences and Materials Branch, 2941 Hobson Way, Wright-Patterson Air Force Base, OH 45433 (United States)
  • 5. Department of Polymer Engineering and Science, Montanuniversität Leoben, Otto-Glöckel-Strasse 12, A-8700 Leoben (Austria)

Description

Monolithic single phase cubic (c) Ti1−xAlxN thin films are used in various industrial applications due to their high thermal stability, which beneficially effects lifetime and performance of cutting and milling tools, but also find increasing utilization in electronic and optical devices. The present study elucidates the temperature-driven evolution of heat conductivity, electrical resistivity and optical reflectance from room temperature up to 1400 °C and links them to structural and chemical changes in Ti1−xAlxN coatings. It is shown that various decomposition phenomena, involving recovery and spinodal decomposition (known to account for the age hardening phenomenon in c-Ti1−xAlxN), as well as the cubic to wurtzite phase transformation of spinodally formed AlN-enriched domains, effectively increase the thermal conductivity of the coatings from ∼3.8 W m−1 K−1 by a factor of three, while the electrical resistivity is reduced by one order of magnitude. A change in the coating color from metallic grey after deposition to reddish-golden after annealing to 1400 °C is related to the film structure and discussed in terms of film reflectivity.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2012.01.005

Additional details

Identifiers

DOI
10.1016/j.actamat.2012.01.005;
PII
S1359-6454(12)00032-8;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
60
Journal Issue
5
Journal Page Range
p. 2091-2096
ISSN
1359-6454
CODEN
ACMAFD

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.