Design and analysis of visible photonics resonators coated with CuO thin film
- 1. Department of Electronics & Communication Engineering, Motilal Nehru National Institute of Technology Allahabad, Prayagraj-211004 (India)
Description
The optical and structural properties of CuO film deposited on n-Si via spin-coating method have been ascertained for diverse annealing times. The characterizations were made using x-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), UV–vis spectroscopy, ellipsometry spectroscopy and photoluminescence. A detailed analysis revealed the favorable behavior of CuO film for visible photonics resonators such as Fabry–Perot (FP) and ring resonators. The best suitable property was obtained for a film annealed for 15 min. Accordingly, the CuO-film-coated resonators were simulated and analyzed theoretically using the MODE Solutions tool by Lumerical and MATLAB. In the FP resonator, the transmission intensity, contrast factor and finesse were computed for different annealing times and angles of light incidence. Further, for the CuO ring resonator, an eigenmode solver was incorporated (in the wavelength range 300–900 nm) to compute the effective refractive index, propagation constant, group velocity, losses, dispersion and transmission intensity. Additionally, utilizing the basic expressions, the free spectral range, full-width at half-maximum and quality factor were derived. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6528/ab6469Additional details
Identifiers
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 31
- Journal Issue
- 15
- Journal Page Range
- [17 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53028656
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ANNEALING; COPPER OXIDES; DEPOSITS; ELLIPSOMETRY; FIELD EMISSION; PHOTOLUMINESCENCE; QUALITY FACTOR; REFRACTIVE INDEX; RESONATORS; SCANNING ELECTRON MICROSCOPY; SIMULATION; SOLUTIONS; SPECTROSCOPY; SPIN-ON COATING; THIN FILMS; WAVELENGTHS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; DEPOSITION; DIFFRACTION; DIMENSIONLESS NUMBERS; DISPERSIONS; ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; EMISSION; EQUIPMENT; FILMS; HEAT TREATMENTS; HOMOGENEOUS MIXTURES; LUMINESCENCE; MEASURING METHODS; MICROSCOPY; MIXTURES; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; PHYSICAL PROPERTIES; SCATTERING; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS