Published January 1989
| Version v1
Journal article
A freeman type ion source designed for ion implanter
- 1. Academia Sinica, Shanghai, SH (China). Shanghai Inst. of Nuclear Research
Description
A Freeman type ion source designed for ion implanter is described. The ion source is simple, low consumption and cheap in price. After improving the structure of discharge chamber and extracting system, high quality para-axial ion beam of 0.5-1 mA can be obtained. Conventional two slits method is used for measurements of beam emittance. The energy normalized emittance is 2-4 x 10-5 mm · rad · MeV1/2 and normalized brightness ≥ 7.6 x 1010 A/cm2 · rad. This ion source is suitable for practical uses
Additional details
Publishing Information
- Journal Title
- Nuclear Techniques
- Journal Volume
- 12
- Journal Issue
- 1
- Series
- Nucl. Tech.
- Journal Page Range
- 37-43
- ISSN
- 0253-3219
- CODEN
- NUTED
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 21041060
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- BEAM CURRENTS; BEAM EMITTANCE; BEAM EXTRACTION; BRIGHTNESS; FABRICATION; ION IMPLANTATION; ION SOURCES; IONIZATION CHAMBERS
- Descriptors DEC
- CURRENTS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION DETECTORS