The 3rd International Conference on Solid State Chemistry. Preface
Creators
- 1. Institute of Inorganic Chemistry, Slovak Academy of Sciences, 84236 Bratislava (Slovakia)
Description
The 3rd International Conference on Solid State Chemistry took place on 6-12 July 1996 in Bratislava, Slovakia, under the auspices of the Presidium of the Slovak Academy of Sciences. In the conference participated 158 scientists from many countries of the world. The conference covered all aspects of modern solid state chemistry and the presentation of papers was divided into eight sections consisting of invited lectures and oral as well as poster presentations. The individual sections were devoted to the high-temperature ceramic superconductors, the layered compounds, clathrates and intercalates, the oxide and non-oxide glasses, the structure and properties of solids, the electron structure and chemical bonding in solids, the surface chemistry of solids, the solid state superionic, and to the local structure and bonding cementitious binding materials. (authors)
Additional details
Publishing Information
- Journal Title
- Chemical Papers
- Journal Volume
- 51
- Journal Issue
- 6
- Series
- Previous name of the journal Chemical Papers was Chemicke Zvesti (used in present time, too)
- Journal Page Range
- p. 303
- ISSN
- 0366-6352
- CODEN
- CHZVAN
INIS
- Country of Publication
- Slovakia
- Country of Input or Organization
- Slovakia
- INIS RN
- 31029196
- Subject category
- S36: MATERIALS SCIENCE; S99: GENERAL AND MISCELLANEOUS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- CHERENKOV COUNTERS; ELECTRON SPIN RESONANCE; EQUATIONS; EXPERIMENTAL DATA; PHOTOCHEMISTRY; SEMICONDUCTOR MATERIALS; SOLID STATE PHYSICS; SOLIDS; SUPERCONDUCTORS; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; CHEMISTRY; DATA; INFORMATION; MAGNETIC RESONANCE; MATERIALS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA; PHYSICS; RADIATION DETECTORS; RESONANCE; X-RAY EMISSION ANALYSIS