Published September 1989
| Version v1
Journal article
Application of piezoceramic materials in low temperature scanning tunnel microscope
Description
Temperature dependences of the voltage-to-movement conversion coefficients for piezoceramic domestic materials PKR and TsTS-19 are measured using a capacitance dilatometer in the 0.4<T<300K temperature range. Anisotropy of thermal expansion of materials determined by the polarization vector is observed. Some recommendations concerning the use of the given materials in low-temperature scanning tunnel microscopes are given
Additional details
Additional titles
- Original title (Russian)
- Primenenie p'ezokeramicheskikh materialov PKR v nizkotemperaturnykh skaniruyushchikh tunnel'nykh mikroskopakh
Publishing Information
- Journal Title
- Pribory i Tekhnika Ehksperimenta
- Journal Issue
- no.5
- Series
- Prib. Tekh. Ehksp.
- ISSN
- 0032-8162
- CODEN
- PRTEA
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- USSR
- INIS RN
- 22023750
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CERAMICS; MICROSCOPES; PERFORMANCE TESTING; PIEZOELECTRICITY; TEMPERATURE DEPENDENCE; THERMAL EXPANSION; THERMOELECTRIC PROPERTIES; TUNNEL EFFECT; ULTRALOW TEMPERATURE; VERY LOW TEMPERATURE
- Descriptors DEC
- ELECTRICAL PROPERTIES; ELECTRICITY; EXPANSION; PHYSICAL PROPERTIES; TESTING