Published August 3, 2011 | Version v1
Journal article

Advances on surface structural determination by LEED

  • 1. Departamento de Fisica, ICEX, Universidade Federal de Minas Gerais, 31270-090, Belo Horizonte, MG (Brazil)
  • 2. Grupo de Fisica de SuperfIcies e Materiais, Instituto de Fisica and Instituto Nacional de Ciencia e Tecnologia em Energia e Ambiente (CIENAM)INCT-E and A, Universidade Federal da Bahia, Campus Universitario da Federacao, 40170-115, Salvador, BA (Brazil)

Description

In the last 40 years, low energy electron diffraction (LEED) has proved to be the most reliable quantitative technique for surface structural determination. In this review, recent developments related to the theory that gives support to LEED structural determination are discussed under a critical analysis of the main theoretical approximation-the muffin-tin calculation. The search methodologies aimed at identifying the best matches between theoretical and experimental intensity versus voltage curves are also considered, with the most recent procedures being reviewed in detail. (topical review)

Availability note (English)

Available from http://dx.doi.org/10.1088/0953-8984/23/30/303001

Additional details

Identifiers

DOI
10.1088/0953-8984/23/30/303001;
PII
S0953-8984(11)89213-1;

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
23
Journal Issue
30
Journal Page Range
[19 p.]
ISSN
0953-8984
CODEN
JCOMEL

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43010136
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ELECTRIC POTENTIAL; ELECTRON DIFFRACTION; MUFFIN-TIN POTENTIAL; SIMULATION; SURFACES
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; POTENTIALS; SCATTERING