Published August 3, 2011
| Version v1
Journal article
Advances on surface structural determination by LEED
- 1. Departamento de Fisica, ICEX, Universidade Federal de Minas Gerais, 31270-090, Belo Horizonte, MG (Brazil)
- 2. Grupo de Fisica de SuperfIcies e Materiais, Instituto de Fisica and Instituto Nacional de Ciencia e Tecnologia em Energia e Ambiente (CIENAM)INCT-E and A, Universidade Federal da Bahia, Campus Universitario da Federacao, 40170-115, Salvador, BA (Brazil)
Description
In the last 40 years, low energy electron diffraction (LEED) has proved to be the most reliable quantitative technique for surface structural determination. In this review, recent developments related to the theory that gives support to LEED structural determination are discussed under a critical analysis of the main theoretical approximation-the muffin-tin calculation. The search methodologies aimed at identifying the best matches between theoretical and experimental intensity versus voltage curves are also considered, with the most recent procedures being reviewed in detail. (topical review)
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-8984/23/30/303001Additional details
Identifiers
- DOI
- 10.1088/0953-8984/23/30/303001;
- PII
- S0953-8984(11)89213-1;
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 23
- Journal Issue
- 30
- Journal Page Range
- [19 p.]
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43010136
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRIC POTENTIAL; ELECTRON DIFFRACTION; MUFFIN-TIN POTENTIAL; SIMULATION; SURFACES
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; POTENTIALS; SCATTERING