Published December 15, 2003 | Version v1
Journal article

Study on MgO buffer in ZnO layers grown by plasma-assisted molecular beam epitaxy on Al2O3(0001)

Description

We have investigated effects of MgO buffer layers and its annealing on the structural quality of ZnO layers grown on Al2O3(0001) by plasma assisted molecular beam epitaxy (P-MBE). It was found that surface morphology and crystalline quality of ZnO layers were improved by employing thin MgO buffer layers. Furthermore, annealing of the MgO buffer at high temperatures enhanced the surface migration of adatoms, leading to the formation of larger terraces and smoother surface morphology. We speculate that the relaxation of strain in the MgO buffer contributes to lowering of the surface energy. The dislocation density of ZnO layers was also reduced from 5.3x109 cm-2 to 1.9x109 cm-2 by annealing a low temperature (LT) MgO buffer

Additional details

Identifiers

DOI
10.1016/S0040-6090;
PII
S0040609003011635;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
445
Journal Issue
2
Journal Page Range
p. 213-218
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
3. international symposium on transparent oxide thin films for electronics and optics
Dates
10-11 Apr 2003
Place
Tokyo (Japan)

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.