Published December 15, 2003
| Version v1
Journal article
Study on MgO buffer in ZnO layers grown by plasma-assisted molecular beam epitaxy on Al2O3(0001)
Description
We have investigated effects of MgO buffer layers and its annealing on the structural quality of ZnO layers grown on Al2O3(0001) by plasma assisted molecular beam epitaxy (P-MBE). It was found that surface morphology and crystalline quality of ZnO layers were improved by employing thin MgO buffer layers. Furthermore, annealing of the MgO buffer at high temperatures enhanced the surface migration of adatoms, leading to the formation of larger terraces and smoother surface morphology. We speculate that the relaxation of strain in the MgO buffer contributes to lowering of the surface energy. The dislocation density of ZnO layers was also reduced from 5.3x109 cm-2 to 1.9x109 cm-2 by annealing a low temperature (LT) MgO buffer
Additional details
Identifiers
- DOI
- 10.1016/S0040-6090;
- PII
- S0040609003011635;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 445
- Journal Issue
- 2
- Journal Page Range
- p. 213-218
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 3. international symposium on transparent oxide thin films for electronics and optics
- Dates
- 10-11 Apr 2003
- Place
- Tokyo (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37013693
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM OXIDES; ANNEALING; DISLOCATIONS; LAYERS; MAGNESIUM OXIDES; MOLECULAR BEAM EPITAXY; SURFACE ENERGY; ZINC OXIDES
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ALUMINIUM COMPOUNDS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL GROWTH METHODS; CRYSTAL STRUCTURE; ENERGY; EPITAXY; FREE ENERGY; HEAT TREATMENTS; LINE DEFECTS; MAGNESIUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SURFACE PROPERTIES; THERMODYNAMIC PROPERTIES; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.