Published May 7, 2015 | Version v1
Journal article

Néel temperature of Cr2O3 in Cr2O3/Co exchange-coupled system: Effect of buffer layer

  • 1. Department of Electronic Engineering, Tohoku University, Sendai 980-8579 (Japan)
  • 2. Advanced Technology Development Center, TDK Corporation, Ichikawa 272-0026 (Japan)

Description

The lattice parameter dependence of the Néel temperature TN of thin Cr2O3 in a Cr2O3/Co exchange-coupled system is investigated. Lattice-mismatch-induced strain is generated in Cr2O3 by using different buffer layers. The lattice parameters are determined from out-of-plane and in-plane X-ray diffraction measurements. The Néel temperature is detected by direct temperature-dependent magnetization measurement as well as the temperature-dependent interface exchange coupling energy. It is observed that in-plane lattice contraction can enhance TN in Cr2O3, which is consistent with theoretical calculations

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Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
117
Journal Issue
17
Journal Page Range
vp.
ISSN
0021-8979
CODEN
JAPIAU

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