UV protection filters by dielectric multilayer thin films on Glass BK-7 and Infrasil 301
- 1. Physics Department, Faculty of Education, Ain Shams University, Cairo 11566 (Egypt)
- 2. Vacuum Coating Manager, Arab International Optronics Co., El-salam City, Cairo 11566 (Egypt)
- 3. Head of Thermal Analysis Lab, National Center for Radiation Research and Technology, Cairo 11566 (Egypt)
- 4. Engineering Physics Department, Faculty of Engineering, Ain Shams University, Cairo 11566 (Egypt)
Description
The increasing use of Ultraviolet (UV) light in medicine, industrial environments, for cosmetic use, and even in consumer products necessitates that greater attention be paid to the potential hazards of this type of electromagnetic radiation. To avoid any adverse effects of exposure to this type of radiation, four suitable protection filters were produced to block three UV bands (UVA, UVB, and UVC). The design structure of the required dielectric multilayer filters was done by optical thin film technology using the absorbing property of UV radiation for the substrates and dielectric materials. The computer analyses of the multilayer filter formulas were prepared using Macleod Software for the production processes. The deposition technique was achieved on optical substrates (Glass BK-7 and Infrasil 301) by dielectric material combinations including Titanium dioxide (Ti2O3), Hafnium dioxide (HfO2), and Lima (mixture of oxides SiO2/Al2O3); deposition being achieved using an electron beam gun. The output results of the theoretical and experimental transmittance values for spectral band from 200 nm to 800 nm were discussed in four processes. To analyze the suitability for use in 'real world' applications, the test pieces were subjected to the durability tests (adhesion, abrasion resistance, and humidity) according to Military Standard MIL-C-675C and MIL-C-48497A
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2005.12.077;
- PII
- S0169-4332(05)01694-6;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 252
- Journal Issue
- 24
- Journal Page Range
- p. 8716-8723
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38104356
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; COMPUTER CODES; DEPOSITION; DIELECTRIC MATERIALS; ELECTRON BEAMS; FILTERS; GLASS; HAFNIUM OXIDES; SILICON OXIDES; THIN FILMS; TITANIUM OXIDES; ULTRAVIOLET RADIATION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; BEAMS; CHALCOGENIDES; ELECTROMAGNETIC RADIATION; FILMS; HAFNIUM COMPOUNDS; LEPTON BEAMS; MATERIALS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; RADIATIONS; REFRACTORY METAL COMPOUNDS; SILICON COMPOUNDS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.