Application of CR-39 detectors for study of corpuscular emission from Prague capillary pinch
Description
The paper describes experimental studies of the corpuscular emission from fast Z-pinch discharges, which were performed within the CAPEX capillary pinch facility in Prague, Czech Republic. Time-integrated measurements were carried out with an ion pinhole camera equipped with CR-39 nuclear track detectors. Irradiated detectors were etched at the standard conditions, and developed tracks were analysed with an optical microscope coupled with a CCD camera. It was found that the fast capillary discharges emit strong corpuscular streams. On the basis of the optical analysis of the etched detectors it was estimated that the time-integrated particle flux, at the distance of 20 cm from the collimator outlet, was about 3.5x107 particles/cm2/pulse. Particular attention was paid to analysis of ion-track photos, which were obtained by means of an electron microscope. Details of the ion micro-craters have been observed in the photos of fractures of the CR-39 detectors after their 7 h etching
Additional details
Identifiers
- DOI
- 10.1016/S1350-4487(03)00144-6;
- arXiv
- arXiv:nucl-th/9811076v2;
- PII
- S1350448703001446;
Publishing Information
- Journal Title
- Radiation Measurements
- Journal Volume
- 36
- Journal Issue
- 1-6
- Journal Page Range
- p. 321-325
- ISSN
- 1350-4487
- CODEN
- RMEAEP
Conference
- Title
- 21. international conference on nuclear tracks in solids
- Dates
- 21-25 Oct 2003
- Place
- New Delhi (India)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35033300
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DIELECTRIC TRACK DETECTORS; ELECTRIC DISCHARGES; ETCHING; ION EMISSION; LINEAR Z PINCH DEVICES; PARTICLE TRACKS; PLASTICS
- Descriptors DEC
- EMISSION; LINEAR PINCH DEVICES; MATERIALS; MEASURING INSTRUMENTS; OPEN PLASMA DEVICES; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PETROCHEMICALS; PETROLEUM PRODUCTS; PINCH DEVICES; POLYMERS; RADIATION DETECTORS; SURFACE FINISHING; SYNTHETIC MATERIALS; THERMONUCLEAR DEVICES
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.