Published August 1984 | Version v1
Journal article Metadata-only

The use of aluminium γ-ray yield ratio for sample uniformity and surface contamination check in PIXE analysis

Creators

  • 1. Helsinki Univ. (Finland). Dept. of Physics

Description

A simple and fast procedure for measuring sample uniformity and surface contamination simultaneously with PIXE analysis is presented. Points relating to physical parameters and limitations of the method are discussed. (orig.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods Phys. Res., Sect. B
Journal Volume
232
Journal Issue
3
Series
CODEN: NIMBE.;Nucl. Instrum. Methods Phys. Res., Sect. B.
Journal Page Range
404-407
ISSN
0168-583X

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
15071767
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
ALUMINIUM; MEASURING METHODS; PIXE ANALYSIS; SURFACE COATING; SURFACE CONTAMINATION; X RADIATION; X-RAY SPECTRA
Descriptors DEC
CHEMICAL ANALYSIS; CONTAMINATION; DEPOSITION; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; METALS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; SPECTRA; X-RAY EMISSION ANALYSIS