Published August 22, 2003 | Version v1
Journal article

Silicon surface processing techniques for micro-systems fabrication

Description

Micromachining of silicon surface and near-surface regions by electron-beam lithography (EBL) and reactive ion dry-etching (RIE), as well as by laser microfabrication techniques is described. Combination of EBL and RIE techniques is used to fabricate quasi two-dimensional (2D) photonic crystal (PhC) structures with aspect ratios at approximately 15. Structural and optical properties of PhC samples with 2D honeycomb lattice are reported, and a complete photonic band gap at wavelengths approximately 2.16 μm is identified from the optical transmission data. Next, laser microfabrication of silicon by femtosecond laser pulses is reported. Processing of silicon under low air pressure conditions (≅5 Torr) is demonstrated to be essentially debris-free process, highly suitable for cutting and scribing of wafers as well for hole drilling. Removal of thin films from the silicon surface by a single-shot laser ablation using mask projection is also demonstrated

Additional details

Identifiers

DOI
10.1016/S0040-6090;
PII
S0040609003008034;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
438-439
Journal Issue
1-2
Journal Page Range
p. 445-451
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
5. international conference on nano-molecular electronics
Dates
10-12 Dec 2002
Place
Kobe (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37013528
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABLATION; ASPECT RATIO; CRYSTALS; DATA TRANSMISSION; ELECTRON BEAMS; ETCHING; FABRICATION; IONS; LASERS; NANOSTRUCTURES; OPTICAL PROPERTIES; PROCESSING; SILICON; SURFACES; THIN FILMS
Descriptors DEC
BEAMS; CHARGED PARTICLES; COMMUNICATIONS; DIMENSIONLESS NUMBERS; ELEMENTS; FILMS; LEPTON BEAMS; PARTICLE BEAMS; PHYSICAL PROPERTIES; SEMIMETALS; SURFACE FINISHING

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.