Silicon surface processing techniques for micro-systems fabrication
Description
Micromachining of silicon surface and near-surface regions by electron-beam lithography (EBL) and reactive ion dry-etching (RIE), as well as by laser microfabrication techniques is described. Combination of EBL and RIE techniques is used to fabricate quasi two-dimensional (2D) photonic crystal (PhC) structures with aspect ratios at approximately 15. Structural and optical properties of PhC samples with 2D honeycomb lattice are reported, and a complete photonic band gap at wavelengths approximately 2.16 μm is identified from the optical transmission data. Next, laser microfabrication of silicon by femtosecond laser pulses is reported. Processing of silicon under low air pressure conditions (≅5 Torr) is demonstrated to be essentially debris-free process, highly suitable for cutting and scribing of wafers as well for hole drilling. Removal of thin films from the silicon surface by a single-shot laser ablation using mask projection is also demonstrated
Additional details
Identifiers
- DOI
- 10.1016/S0040-6090;
- PII
- S0040609003008034;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 438-439
- Journal Issue
- 1-2
- Journal Page Range
- p. 445-451
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 5. international conference on nano-molecular electronics
- Dates
- 10-12 Dec 2002
- Place
- Kobe (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37013528
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABLATION; ASPECT RATIO; CRYSTALS; DATA TRANSMISSION; ELECTRON BEAMS; ETCHING; FABRICATION; IONS; LASERS; NANOSTRUCTURES; OPTICAL PROPERTIES; PROCESSING; SILICON; SURFACES; THIN FILMS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; COMMUNICATIONS; DIMENSIONLESS NUMBERS; ELEMENTS; FILMS; LEPTON BEAMS; PARTICLE BEAMS; PHYSICAL PROPERTIES; SEMIMETALS; SURFACE FINISHING
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.