Published August 2008 | Version v1
Journal article Metadata-only

Data analysis techniques for microwave imaging reflectometry

Creators

  • 1. Graduate Univ. for Advanced Studies, Toki, Gifu (Japan)
  • 2. National Inst. for Fusion Science, Toki, Gifu (JP)
  • 3. National Inst. of Advanced Industrial Science and Technology, Tsukuba, Ibaraki (JP)

Description

A data analysis technique for microwave imaging reflectometry (MIR) in the Large Helical Devices (LHD) and TPE-RX plasmas has been investigated. In LHD, the fast Fourier transform (FFT) is employed. The statistical properties of the fluctuation spectra on MIR signals are quantified by the time-frequency analysis by the ensemble average technique. Statistical analyses using cross-correlation and coherence spectra reveal the characteristics of MHD modes, such as wave numbers, mode numbers, and phase velocity. In TPE-RX, the wavelet analysis is more useful because the phenomena are transient in TPE-RX plasma. (author)

Additional details

Identifiers

DOI
10.1585/pfr.3.S1045;

Publishing Information

Journal Title
Plasma and Fusion Research
Journal Volume
3
Journal Issue
special issue
Journal Page Range
p. S1045.1-S1045.7
ISSN
1880-6821

Conference

Title
17. international Toki conference on physics of flows and turbulence in plasmas; ISHW-16: 16. international stellarator/heliotron workshop
Acronym
ITC-17
Dates
15-19 Oct 2007
Place
Toki, Gifu (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
40058168
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DATA ANALYSIS; FLUCTUATIONS; FOURIER ANALYSIS; FOURIER TRANSFORM SPECTROMETERS; LHD DEVICE; MAGNETOHYDRODYNAMICS; MICROWAVE EQUIPMENT; OSCILLATION MODES; PLASMA DENSITY; PLASMA DIAGNOSTICS; PLASMA RADIAL PROFILES; PLASMA WAVES; SIGNAL-TO-NOISE RATIO; TPE-RX DEVICE; WAVE PROPAGATION
Descriptors DEC
CLOSED PLASMA DEVICES; DIMENSIONLESS NUMBERS; ELECTRONIC EQUIPMENT; EQUIPMENT; FLUID MECHANICS; HYDRODYNAMICS; MEASURING INSTRUMENTS; MECHANICS; PINCH DEVICES; REVERSED-FIELD PINCH DEVICES; SPECTROMETERS; THERMONUCLEAR DEVICES; TOROIDAL PINCH DEVICES; VARIATIONS

Optional Information

Notes
15 refs., 8 figs.